Keithley 2657A: High-Power System SourceMeter for Precision Measurements

Description

Keithley 2657A High Power System SourceMeter: Precision and Power for Demanding Applications

The Keithley 2657A High Power System SourceMeter is a versatile and powerful instrument designed to meet the challenges of high-power testing and characterization. With its exceptional precision, wide measurement range, and advanced features, the 2657A empowers engineers and researchers to accurately and efficiently evaluate the performance of electronic devices and systems.

Product Specifications:

1 channel
Current range: 0.12 A
Voltage range: 3000 V
Power range: 180 W
Resolution: 100 nA, 100 µV

High Power Output: Delivers up to 180 W of power, enabling testing of high-power devices and systems.
Wide Measurement Range: Measures current from 100 nA to 0.12 A and voltage from 100 µV to 3000 V, providing comprehensive characterization capabilities.
Precision and Accuracy: Ensures accurate and reliable measurements with high resolution and low noise.
Advanced Triggering and Synchronization: Supports external triggering and synchronization for precise timing and coordination with other instruments.
Intuitive User Interface: Features a user-friendly graphical interface for easy setup and operation.
Remote Control: Allows for remote control via GPIB, USB, or Ethernet interfaces, enabling integration into automated test systems.

Accelerating Testing: Its high power output and wide measurement range enable faster and more efficient testing of high-power devices.
Improving Accuracy: Precision measurements ensure reliable and repeatable results, reducing the risk of errors and rework.
Simplifying Integration: Advanced triggering and synchronization capabilities simplify integration into complex test setups.
Enhancing Productivity: Intuitive user interface and remote control options streamline operation and increase productivity.
Ensuring Reliability: Backed by Keithley’s reputation for quality and reliability, the 2657A provides peace of mind for critical testing applications.

Additional information