EA-EL 9080-45 DT: High-Performance DC Electronic Loads for Demanding Applications

Description

EA-EL 9080-45 DT DC Electronic Loads: Precision Power Testing for Demanding Applications

The EA-EL 9080-45 DT DC Electronic Load is a high-performance testing solution designed to meet the rigorous demands of power electronics testing. With its wide power range (450 – 900 W), high voltage (80 VDC), and substantial current capacity (45 ADC), this electronic load is ideal for testing a wide range of power supplies, batteries, and other power sources.

Product Specifications:

Power Range: 450 – 900 W
Voltage Range: 0 – 80 VDC
Current Range: 0 – 45 ADC
Power Factor: 0.99
Efficiency: >90%

High Power Density: The compact design of the EA-EL 9080-45 DT allows for maximum power output in a small footprint, saving valuable bench space.
Versatile Load Modes: Supports constant current (CC), constant voltage (CV), constant power (CP), and constant resistance (CR) modes, providing flexibility for various testing scenarios.
Advanced Control Interface: Intuitive front panel controls and a clear LCD display enable precise parameter setting and real-time monitoring.
Remote Control and Data Logging: RS-232 and USB interfaces allow for remote control and data logging, facilitating automated testing and data analysis.
Protection Features: Built-in overvoltage, overcurrent, and overtemperature protection ensure safe and reliable operation.

Value to the Customer:

The EA-EL 9080-45 DT DC Electronic Load offers exceptional value to customers by:

Reducing Testing Time: Its high power density and versatile load modes enable efficient and comprehensive testing, saving time and resources.
Ensuring Accuracy and Reliability: Precision control and advanced protection features guarantee accurate and reliable test results, reducing the risk of errors and costly rework.
Simplifying Test Setup: Intuitive controls and remote control capabilities streamline test setup and operation, enhancing productivity.
Protecting Equipment: Built-in protection mechanisms safeguard both the electronic load and the devices under test, minimizing downtime and maintenance costs.

Additional information